Böcker i High Reliability and Crisis Management-serien

Aimed at an "intellectual trade" audience, Dirty Rotten Strategies discusses how and why organizations and special interest groups of all kinds attempt to trick us into solving the wrong problems precisely.

This book develops a typology of crisis narratives (accounts of blame, stories of renewal, victim narratives, heroic tales, and memorials), that provide an organizing framework for analyzing crises and understanding how competing stories battle for dominance in the wake of a disaster.

This volume furnishes insights about the financial crisis and how to move beyond it from the perspectives of aesthetic management, high reliability and crisis management, and sustainability science.

Reliability has become a watchword in the business community. It refers to anticipation and resilience organizations' ability to plan for, absorb, and rebound from shocks. This book addresses the severe limits of formal design and technology relative to operational skills, experience, and knowledge.

Rather than acts of God or random acts of nature, The Social Roots of Risk argues that hazards, disasters, and crises of all sorts are produced by the social order itself-that the routine activities of institutions, organizations, and groups invite risk into our lives and put us in harms way.

Community at Risk examines civic response to the federal government's plans to build biodefense labs at three universities following the Anthrax attacks in 2001. Thomas D. Beamish's account affirms the importance of local political dynamics in shaping public perceptions of risk and its management.

Ranga Ramanujam is Professor at Vanderbilt University's Owen Graduate School of Management. He serves on the editorial board of Stanford's High Reliability and Crisis Management series.Karlene H. Roberts is Professor Emeritus at The Haas School of Business, University of California, Berkeley, where she is also Chair of the Center for Catastrophic Risk Management. She is co-editor of Stanford's High Reliability and Crisis Management series.