Böcker i Series in Microscopy in Materials Science-serien

Studying material properties from their geometrical measurements, this work provides a framework for a specialized application of electron microscopy for metals and alloys and, by extension, for ceramics, minerals, and semiconductors. Each step of the analysis process is clearly described, from data collection through processing to applications.

Details the electron microscopy methods used to investigate complex and fine-scale microstructures, such as those produced by fast-particle irradiation of metals or ion implantation of semiconductors. This book also focuses on the methods used to characterize small point-defect clusters, such as dislocation loops.