Scanning and stationary-beam electron microscopes are indispensable tools for both research and routine evaluation in materials science, the semiconductor industry, nanotechnology and the biological, forensic, and medical sciences.
This standard guide to electron energy-loss spectroscopy covers instrumentation, physics, procedures and results. The 3rd edition adds new equipment, advances in electron-scattering theory, spectral and image processing, and new applications in nanotechnology.
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