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Advancements in AI and IoT for Chip Manufacturing and Defect Prevention

av Rupal Jain
Advancements in AI and IoT for Chip Manufacturing and Defect Prevention av Rupal Jain
Om Advancements in AI and IoT for Chip Manufacturing and Defect Prevention

This is essential reading for semiconductor professionals seeking to expand their knowledge on silicon processes, understand defect prevention, and explore optimizing processes by reducing defects using AI and IoT technologies. It charts a course where semiconductor manufacturing defects are minimized and maximizes productivity.

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  • Språk:
  • Engelska
  • ISBN:
  • 9788770046817
  • Format:
  • Häftad
  • Sidor:
  • 138
  • Utgiven:
  • 25. november 2024
  • Mått:
  • 156x234x0 mm.
  • Vikt:
  • 281 g.
  Fri leverans
Leveranstid: 2-4 veckor
Förväntad leverans: 27. december 2024
Förlängd ångerrätt till 31. januari 2025

Om Rupal Jain

Se alla böcker av Rupal Jain

Beskrivning av Advancements in AI and IoT for Chip Manufacturing and Defect Prevention

This is essential reading for semiconductor professionals seeking to expand their knowledge on silicon processes, understand defect prevention, and explore optimizing processes by reducing defects using AI and IoT technologies. It charts a course where semiconductor manufacturing defects are minimized and maximizes productivity.

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