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  5. Characterisation of Radiation Damage by Transmission Electron Microscopy

Characterisation of Radiation Damage by Transmission Electron Microscopy

av M.L Jenkins

del av Series in Microscopy in Materials Science-serien

Characterisation of Radiation Damage by Transmission Electron Microscopy av M.L Jenkins
Om Characterisation of Radiation Damage by Transmission Electron Microscopy

Details the electron microscopy methods used to investigate complex and fine-scale microstructures, such as those produced by fast-particle irradiation of metals or ion implantation of semiconductors. This book also focuses on the methods used to characterize small point-defect clusters, such as dislocation loops.

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  • Språk:
  • Engelska
  • ISBN:
  • 9780750307482
  • Format:
  • Inbunden
  • Sidor:
  • 234
  • Utgiven:
  • 21. november 2000
  • Mått:
  • 156x234x19 mm.
  • Vikt:
  • 540 g.
  Fri leverans
Leveranstid: 2-4 veckor
Förväntad leverans: 10. mars 2025

Om M.L Jenkins

Se alla böcker av M.L Jenkins

Beskrivning av Characterisation of Radiation Damage by Transmission Electron Microscopy

Details the electron microscopy methods used to investigate complex and fine-scale microstructures, such as those produced by fast-particle irradiation of metals or ion implantation of semiconductors. This book also focuses on the methods used to characterize small point-defect clusters, such as dislocation loops.

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