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Microscopy of Semiconducting Materials

- 1999 Proceedings of the Institute of Physics Conference held 22-25 March 1999, University of Oxford, UK

Om Microscopy of Semiconducting Materials

Presents an overview of advances in semiconductor studies using microscopy. This book explores the use of transmission and scanning electron microscopy, ultra fine electron probes, and EELS to investigate semi conducting structures. It is suitable for academics and researchers in materials science, and electrical and electronic engineering.

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  • Språk:
  • Engelska
  • ISBN:
  • 9780750306508
  • Format:
  • Inbunden
  • Sidor:
  • 772
  • Utgiven:
  • 1. januari 2000
  • Mått:
  • 156x234x41 mm.
  • Vikt:
  • 1428 g.
Leveranstid: 2-4 veckor
Förväntad leverans: 4. februari 2025

Beskrivning av Microscopy of Semiconducting Materials

Presents an overview of advances in semiconductor studies using microscopy. This book explores the use of transmission and scanning electron microscopy, ultra fine electron probes, and EELS to investigate semi conducting structures. It is suitable for academics and researchers in materials science, and electrical and electronic engineering.

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