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  4. On-Wafer Calibration Techniques Enabling Accurate Characterization of High-Performance Silicon Devices at the mm-Wave Range and Beyond

On-Wafer Calibration Techniques Enabling Accurate Characterization of High-Performance Silicon Devices at the mm-Wave Range and Beyond

av Andrej Rumiantsev

del av River Publishers Series in Electronic Materials and Devices-serien

On-Wafer Calibration Techniques Enabling Accurate Characterization of High-Performance Silicon Devices at the mm-Wave Range and Beyond av Andrej Rumiantsev
Om On-Wafer Calibration Techniques Enabling Accurate Characterization of High-Performance Silicon Devices at the mm-Wave Range and Beyond

Presents solutions for accurate mm-wave characterization of advanced semiconductor devices. The book guides readers through the process of development, implementation and verification of the in-situ calibration methods optimized for high-performance silicon technologies.

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  • Språk:
  • Engelska
  • ISBN:
  • 9788770221122
  • Format:
  • Inbunden
  • Sidor:
  • 278
  • Utgiven:
  • 31. juli 2019
  • Mått:
  • 156x234x0 mm.
  • Vikt:
  • 526 g.
  Fri leverans
Leveranstid: 2-4 veckor
Förväntad leverans: 17. december 2024

Om Andrej Rumiantsev

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Beskrivning av On-Wafer Calibration Techniques Enabling Accurate Characterization of High-Performance Silicon Devices at the mm-Wave Range and Beyond

Presents solutions for accurate mm-wave characterization of advanced semiconductor devices. The book guides readers through the process of development, implementation and verification of the in-situ calibration methods optimized for high-performance silicon technologies.

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