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Reliability and Failure of Electronic Materials and Devices

av Milton (Stevens Institute of Technology Ohring
Reliability and Failure of Electronic Materials and Devices av Milton (Stevens Institute of Technology Ohring
Om Reliability and Failure of Electronic Materials and Devices

Offers coverage of some of the major topics related to the performance and failure of materials used in electronic devices and electronics packaging. This book explains the common mechanisms that lead to electronics materials failures, including dielectric breakdown, hot-electron effects and radiation damage.

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  • Språk:
  • Engelska
  • ISBN:
  • 9780120885749
  • Format:
  • Inbunden
  • Sidor:
  • 758
  • Utgiven:
  • 23. oktober 2014
  • Utgåva:
  • 2
  • Mått:
  • 165x232x46 mm.
  • Vikt:
  • 1224 g.
Leveranstid: 2-4 veckor
Förväntad leverans: 28. maj 2025

Om Milton (Stevens Institute of Technology Ohring

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Offers coverage of some of the major topics related to the performance and failure of materials used in electronic devices and electronics packaging. This book explains the common mechanisms that lead to electronics materials failures, including dielectric breakdown, hot-electron effects and radiation damage.

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