Marknadens största urval
Fri frakt över 199 kr
Snabb leverans
Hjälp
Logga in
  1. Hem
  2. Böcker
  3. Företagande & lärande
  4. Data & IT
  5. Reliability Wearout Mechanisms in Advanced CMOS Technologies

Reliability Wearout Mechanisms in Advanced CMOS Technologies

av Alvin W. (IBM) Strong

del av IEEE Press Series on Microelectronic Systems-serien

Reliability Wearout Mechanisms in Advanced CMOS Technologies av Alvin W. (IBM) Strong
Om Reliability Wearout Mechanisms in Advanced CMOS Technologies

This invaluable resource tells the complete story of failure mechanisms from basic concepts to the tools necessary to conduct reliability tests and analyze the results. Both a text and a reference work for this important area of semiconductor technology, it assumes no reliability education or experience.

Visa mer
  • Språk:
  • Engelska
  • ISBN:
  • 9780471731726
  • Format:
  • Inbunden
  • Sidor:
  • 640
  • Utgiven:
  • 4 September 2009
  • Mått:
  • 164x243x34 mm.
  • Vikt:
  • 993 g.
Leveranstid: 2-4 veckor
Förväntad leverans: 23 Oktober 2024

Om Alvin W. (IBM) Strong

Se alla böcker av Alvin W. (IBM) Strong

Beskrivning av Reliability Wearout Mechanisms in Advanced CMOS Technologies

This invaluable resource tells the complete story of failure mechanisms from basic concepts to the tools necessary to conduct reliability tests and analyze the results. Both a text and a reference work for this important area of semiconductor technology, it assumes no reliability education or experience.

Användarnas betyg av Reliability Wearout Mechanisms in Advanced CMOS Technologies



Andra köpte även...
Hitta liknande böcker
Boken Reliability Wearout Mechanisms in Advanced CMOS Technologies finns i följande kategorier:

Gör som tusentals andra bokälskare

Prenumerera på vårt nyhetsbrev för att få fantastiska erbjudanden och inspiration för din nästa läsning.