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  5. Reliability Wearout Mechanisms in Advanced CMOS Technologies

Reliability Wearout Mechanisms in Advanced CMOS Technologies

av Alvin W. (IBM) Strong

del av IEEE Press Series on Microelectronic Systems-serien

Reliability Wearout Mechanisms in Advanced CMOS Technologies av Alvin W. (IBM) Strong
Om Reliability Wearout Mechanisms in Advanced CMOS Technologies

This invaluable resource tells the complete story of failure mechanisms from basic concepts to the tools necessary to conduct reliability tests and analyze the results. Both a text and a reference work for this important area of semiconductor technology, it assumes no reliability education or experience.

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  • Språk:
  • Engelska
  • ISBN:
  • 9780471731726
  • Format:
  • Inbunden
  • Sidor:
  • 640
  • Utgiven:
  • 4. september 2009
  • Mått:
  • 164x243x34 mm.
  • Vikt:
  • 993 g.
Leveranstid: 2-4 veckor
Förväntad leverans: 11. december 2024

Om Alvin W. (IBM) Strong

Se alla böcker av Alvin W. (IBM) Strong

Beskrivning av Reliability Wearout Mechanisms in Advanced CMOS Technologies

This invaluable resource tells the complete story of failure mechanisms from basic concepts to the tools necessary to conduct reliability tests and analyze the results. Both a text and a reference work for this important area of semiconductor technology, it assumes no reliability education or experience.

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