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  5. Introduction to Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) and its Application to Materials Science

Introduction to Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) and its Application to Materials Science

av Sarah Fearn

del av IOP Concise Physics-serien

Introduction to Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) and its Application to Materials Science av Sarah Fearn
Om Introduction to Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) and its Application to Materials Science

Highlights the application of Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) for high-resolution surface analysis and characterization of materials. While providing a brief overview of the principles of SIMS, it also provides examples of how dual-beam ToF-SIMS is used to investigate a range of materials systems and properties.

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  • Språk:
  • Engelska
  • ISBN:
  • 9781681740249
  • Format:
  • Häftad
  • Sidor:
  • 66
  • Utgiven:
  • 16. oktober 2015
  • Mått:
  • 256x177x8 mm.
  • Vikt:
  • 192 g.
  Fri leverans
Leveranstid: 2-4 veckor
Förväntad leverans: 24. december 2024
Förlängd ångerrätt till 31. januari 2025

Om Sarah Fearn

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Beskrivning av Introduction to Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) and its Application to Materials Science

Highlights the application of Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) for high-resolution surface analysis and characterization of materials. While providing a brief overview of the principles of SIMS, it also provides examples of how dual-beam ToF-SIMS is used to investigate a range of materials systems and properties.

Användarnas betyg av Introduction to Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) and its Application to Materials Science



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